A combined TEM and time-resolved optical reflectivity investigation into the excimer-laser crystallization of a-Si films

FC Voogt, R Ishihara

Research output: Contribution to journalArticleScientificpeer-review

16 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)45-47
Number of pages3
JournalThin Solid Films
Volume383
Publication statusPublished - 2001

Keywords

  • ZX Int.klas.verslagjaar < 2002

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