A generic high-throughput microstructure classification and quantification method for regular SEM images of complex steel microstructures combining EBSD labeling and deep learning

Chunguang Shen, Chenchong Wang*, Minghao Huang, Ning Xu, Sybrand van der Zwaag, Wei Xu

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

26 Citations (Scopus)
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