Abstract
High-frequency buck converters need a fast transition of switching nodes
(high dv/dt). Such high dv/dt, especially the positive one, can cause
malfunction of a conventional pulse-triggered active-coupled (PTAC)
level shifter that is used to control the high-side NMOS switch. In this
work, we first discuss the dv/dt immunity of conventional PTAC level
shifters. Subsequently, we propose a new scheme to block the noise
current during the dv/dt sequence, allowing an almost full immunity to
the positive dv/dt. With this scheme, the maximum dv/dt is determined by
how well the circuitry is protected from the overvoltage during the
dv/dt sequence. We design a 20-V buck converter with this level shifter,
fabricated in 180-nm BCD process. Experimental results show it works
correctly under a 67-V/ns dv/dt.
Original language | English |
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Pages (from-to) | 4595 - 4604 |
Number of pages | 10 |
Journal | IEEE Transactions on Circuits and Systems I: Regular Papers |
Volume | 70 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2023 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- buck converter
- Buck converters
- DC-DC converter
- dv/dt immunity
- High-voltage techniques
- Latches
- level shifter
- Microelectronics
- Switches
- Transient analysis
- Transistors