Angular dependence of the ion-induced secondary electron emission for He(+) and Ga(+) beams

V Castaldo, J Winthagen, CW Hagen

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	624-636
Number of pages	13
Journal	Microscopy and Microanalysis
Volume	17
Issue number	4
Publication status	Published - 2011

Keywords

@article{fbaaa958de3f429ba46c67ce0bbda55e,

title = "Angular dependence of the ion-induced secondary electron emission for He(+) and Ga(+) beams",

keywords = "CWTS JFIS < 0.75",

author = "V Castaldo and J Winthagen and CW Hagen",

year = "2011",

language = "Undefined/Unknown",

volume = "17",

pages = "624--636",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "4",

}