Angular dependence of the ion-induced secondary electron emission for He(+) and Ga(+) beams

V Castaldo, J Winthagen, CW Hagen

    Research output: Contribution to journalArticleScientificpeer-review

    9 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)624-636
    Number of pages13
    JournalMicroscopy and Microanalysis
    Volume17
    Issue number4
    Publication statusPublished - 2011

    Keywords

    • CWTS JFIS < 0.75

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