Abstract
We measure the transmission secondary electron yield of nanometer-thick Al2O3/TiN/Al2O3 films using a prototype version of a Timed Photon Counter (TiPC). We discuss the method to measure the yield extensively. The yield is then measured as a function of landing energy between 1.2 and 1.8 keV and found to be in the range of 0.1 (1.2 keV) to 0.9 (1.8 keV). These results are in agreement to data obtained by a different, independent method. We therefore conclude that the prototype TiPC is able to characterise the thin films in terms of transmission secondary electron yield. Additionally, observed features which are unrelated to the yield determination are interpreted.
| Original language | English |
|---|---|
| Article number | P10022 |
| Number of pages | 12 |
| Journal | Journal of Instrumentation |
| Volume | 15 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2020 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.Keywords
- Electron multipliers (vacuum)
- Photon detectors for UV, visible and IR photons (vacuum) (photomultipliers, HPDs, others)
- Timing detectors
- Dynodes and Tynodes