Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain

V Rana; R Ishihara; Y Hiroshima; D Abe; S Higashi; S Inoue; T Shimoda; JW Metselaar; CIM Beenakker

Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain

V Rana, R Ishihara, Y Hiroshima, D Abe, S Higashi, S Inoue, T Shimoda, JW Metselaar, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of The 2003 international workshop on active-matrix liquid-crystal displays - TFT technologies and related materials
Place of Publication	Tokyo
Publisher	Japan Society of Applied Physics
Pages	17-20
Number of pages	4
Publication status	Published - 2003
Event	The tenth international workshop on AM-LCD 2003, Tokyo, Japan - Tokyo Duration: 9 Jul 2003 → 11 Jul 2003

Publication series

Name
Publisher	The Japan Society of Applied Physics

Conference

Conference	The tenth international workshop on AM-LCD 2003, Tokyo, Japan
Period	9/07/03 → 11/07/03

Keywords

Elektrotechniek
Techniek
Conf.proc. > 3 pag

Cite this

Rana, V., Ishihara, R., Hiroshima, Y., Abe, D., Higashi, S., Inoue, S., Shimoda, T., Metselaar, JW., & Beenakker, CIM. (2003). Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain. In Proceedings of The 2003 international workshop on active-matrix liquid-crystal displays - TFT technologies and related materials (pp. 17-20). Japan Society of Applied Physics.

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title = "Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",

author = "V Rana and R Ishihara and Y Hiroshima and D Abe and S Higashi and S Inoue and T Shimoda and JW Metselaar and CIM Beenakker",

year = "2003",

language = "Undefined/Unknown",

publisher = "Japan Society of Applied Physics",

pages = "17--20",

booktitle = "Proceedings of The 2003 international workshop on active-matrix liquid-crystal displays - TFT technologies and related materials",

address = "Japan",

note = "The tenth international workshop on AM-LCD 2003, Tokyo, Japan ; Conference date: 09-07-2003 Through 11-07-2003",

}

Rana, V, Ishihara, R, Hiroshima, Y, Abe, D, Higashi, S, Inoue, S, Shimoda, T, Metselaar, JW & Beenakker, CIM 2003, Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain. in Proceedings of The 2003 international workshop on active-matrix liquid-crystal displays - TFT technologies and related materials. Japan Society of Applied Physics, Tokyo, pp. 17-20, The tenth international workshop on AM-LCD 2003, Tokyo, Japan, 9/07/03.

Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain. / Rana, V; Ishihara, R; Hiroshima, Y et al.
Proceedings of The 2003 international workshop on active-matrix liquid-crystal displays - TFT technologies and related materials. Tokyo: Japan Society of Applied Physics, 2003. p. 17-20.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain

AU - Rana, V

AU - Ishihara, R

AU - Hiroshima, Y

AU - Abe, D

AU - Higashi, S

AU - Inoue, S

AU - Shimoda, T

AU - Metselaar, JW

AU - Beenakker, CIM

PY - 2003

Y1 - 2003

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 17

EP - 20

BT - Proceedings of The 2003 international workshop on active-matrix liquid-crystal displays - TFT technologies and related materials

PB - Japan Society of Applied Physics

CY - Tokyo

T2 - The tenth international workshop on AM-LCD 2003, Tokyo, Japan

Y2 - 9 July 2003 through 11 July 2003

ER -