Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain

V Rana, R Ishihara, Y Hiroshima, D Abe, S Higashi, S Inoue, T Shimoda, JW Metselaar, CIM Beenakker

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings of The 2003 international workshop on active-matrix liquid-crystal displays - TFT technologies and related materials
Place of PublicationTokyo
PublisherJapan Society of Applied Physics
Number of pages4
Publication statusPublished - 2003
EventThe tenth international workshop on AM-LCD 2003, Tokyo, Japan - Tokyo
Duration: 9 Jul 200311 Jul 2003

Publication series

PublisherThe Japan Society of Applied Physics


ConferenceThe tenth international workshop on AM-LCD 2003, Tokyo, Japan


  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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