Detecting faults in peripheral circuits and an evaluation of SRAM tests

AJ van de Goor, S Hamdioui, R Wadsworth

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationProceedings International Test Conference 2004
Place of PublicationWashington, D.C.
PublisherInternational Test Conference
Pages114-123
Number of pages10
ISBN (Print)0-7803-8581-0
Publication statusPublished - 2004
EventInternational Test Conference 2004, Charlotte, USA - Washington, D.C.
Duration: 26 Oct 200428 Oct 2004

Publication series

Name
PublisherInternational Test Conference

Conference

ConferenceInternational Test Conference 2004, Charlotte, USA
Period26/10/0428/10/04

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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