Detecting faults in peripheral circuits and an evaluation of SRAM tests

AJ van de Goor, S Hamdioui, R Wadsworth

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings International Test Conference 2004
Place of Publication	Washington, D.C.
Publisher	International Test Conference
Pages	114-123
Number of pages	10
ISBN (Print)	0-7803-8581-0
Publication status	Published - 2004
Event	International Test Conference 2004, Charlotte, USA - Washington, D.C. Duration: 26 Oct 2004 → 28 Oct 2004

Name
Publisher	International Test Conference

Conference	International Test Conference 2004, Charlotte, USA
Period	26/10/04 → 28/10/04

ed. is niet bekend

Keywords

@inproceedings{6e53f8f5ba504bbd83693f9caa7a0d3c,

title = "Detecting faults in peripheral circuits and an evaluation of SRAM tests",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "{van de Goor}, AJ and S Hamdioui and R Wadsworth",

note = "ed. is niet bekend; International Test Conference 2004, Charlotte, USA ; Conference date: 26-10-2004 Through 28-10-2004",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7803-8581-0",

publisher = "International Test Conference",

pages = "114--123",

booktitle = "Proceedings International Test Conference 2004",

}

TY - GEN

T1 - Detecting faults in peripheral circuits and an evaluation of SRAM tests

AU - van de Goor, AJ

AU - Hamdioui, S

AU - Wadsworth, R

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-8581-0

SP - 114

EP - 123

BT - Proceedings International Test Conference 2004

PB - International Test Conference

CY - Washington, D.C.

T2 - International Test Conference 2004, Charlotte, USA

Y2 - 26 October 2004 through 28 October 2004

ER -