Research output per year
Research output per year
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Dive into the research topics where S. Hamdioui is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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A 115.1 TOPS/W, 12.1 TOPS/mm2Computation-in-Memory using Ring-Oscillator based ADC for Edge AI
Singh, A., Bishnoi, R., Kaichouhi, A., Diware, S., Joshi, R. V. & Hamdioui, S., 2023, AICAS 2023 - IEEE International Conference on Artificial Intelligence Circuits and Systems, Proceeding. Institute of Electrical and Electronics Engineers (IEEE), 5 p. (AICAS 2023 - IEEE International Conference on Artificial Intelligence Circuits and Systems, Proceeding).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Accurate and Energy-Efficient Bit-Slicing for RRAM-Based Neural Networks
Diware, S., Singh, A., Gebregiorgis, A., Joshi, R. V., Hamdioui, S. & Bishnoi, R., 2023, In: IEEE Transactions on Emerging Topics in Computational Intelligence. 7, 1, p. 164 - 177 14 p., 9840507.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile3 Citations (Scopus)6 Downloads (Pure) -
A Survey on Machine Learning in Hardware Security
Köylü, T. C., Reinbrecht, C., Gebregiorgis, A. B., Hamdioui, S. & Taouil, M., 2023, In: ACM Journal on Emerging Technologies in Computing Systems. 19, 2, 37 p., 18.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile79 Downloads (Pure) -
Characterization and Test of Intermittent Over RESET in RRAMs
Xun, H., Fieback, M., Yuan, S., Aziza, H., Heidekamp, M., Copetti, T., Poehls, L. B., Taouil, M. & Hamdioui, S., 2023, Proceeding of the 2023 IEEE 32nd Asian Test Symposium (ATS). Piscataway: IEEE , 6 p. (Asian Test Symposium Proceedings).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs
Xun, H., Fieback, M., Yuan, S., Zhang, Z., Taouil, M. & Hamdioui, S., 2023, Proceedings of the 2023 IEEE European Test Symposium (ETS). IEEE , 6 p. (Proceedings of the European Test Workshop; vol. 2023-May).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Prizes
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DATE'20 Best Paper Award
Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020
Prize: Prize (including medals and awards)
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DFT'21 Outstanding Student Paper
Balakrishnan, Aneesh (Recipient), Cardoso Medeiros, G. (Recipient), Cem Gursoy, Cemil (Recipient), Hamdioui, S. (Recipient), Jenihhin, M. (Recipient) & Alexandrescu, Dan (Recipient), 9 Oct 2021
Prize: Prize (including medals and awards)
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ETS 2021 Best Paper Award
Fieback, M.C.R. (Recipient), Cardoso Medeiros, G. (Recipient), Gebregiorgis, A.B. (Recipient), Aziza, Hassen (Recipient), Taouil, M. (Recipient) & Hamdioui, S. (Recipient), May 2022
Prize: Prize (including medals and awards)
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LATS 2018 Best Paper Award
Fieback, M.C.R. (Recipient), Taouil, M. (Recipient), Hamdioui, S. (Recipient) & Rovatti, Marco (Recipient), 2018
Prize: Prize (including medals and awards)
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LATS 2022 Best Paper Award
Copetti, Thiago (Recipient), Nilovic, Max (Recipient), Fieback, M.C.R. (Recipient), Gemmeke, T. (Recipient), Hamdioui, S. (Recipient) & Poehls, Leticia Bolzani (Recipient), 2023
Prize: Prize (including medals and awards)
Activities
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Journal of Electronic Testing: theory and applications (Journal)
Said Hamdioui (Editor)
1 Jan 2018 → 31 Dec 2018Activity: Publication peer-review and editorial work › Editorial activity
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)
Said Hamdioui (Editor)
1 Jan 2018 → 31 Dec 2018Activity: Publication peer-review and editorial work › Editorial activity
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IEEE Design & Test (Journal)
Said Hamdioui (Editor)
1 Jan 2018 → 31 Dec 2018Activity: Publication peer-review and editorial work › Editorial activity
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Journal of Electronic Testing: theory and applications (Journal)
Said Hamdioui (Editor)
1 Jan 2017 → 31 Dec 2017Activity: Publication peer-review and editorial work › Editorial activity
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)
Said Hamdioui (Editor)
1 Jan 2017 → 31 Dec 2017Activity: Publication peer-review and editorial work › Editorial activity