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Fingerprint Dive into the research topics where S. Hamdioui is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Research Output

2-output spin wave programmable logic gate

Mahmoud, A., Vanderveken, F., Adelmann, C., Ciubotaru, F., Cotofana, S. & Hamdioui, S., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 60-65 6 p. 9155012

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
File
  • 4 Downloads (Pure)

    A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

    Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • 1 Citation (Scopus)

    An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs)

    Aziza, H., Moreau, M., Fieback, M., Taouil, M. & Hamdioui, S., 2020, In : IEEE Access. 8, p. 137263-137274 12 p., 9146996.

    Research output: Contribution to journalArticleScientificpeer-review

    Open Access
    File
  • 3 Downloads (Pure)

    A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 1 Citation (Scopus)
    11 Downloads (Pure)

    Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2020, Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019. Bilof, R. S. (ed.). Piscataway: IEEE, Vol. 2019-December. p. 129-134 6 p. 8949396. (2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 57 Downloads (Pure)

    Prizes

    DATE'20 Best Paper Award

    Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020

    Prize: Prize (including medals and awards)

    File
  • Activities

    • 17 Editorial activity
    • 5 Talk or presentation at a workshop, seminar, course or other meeting
    • 1 Participation in conference
    • 1 Talk or presentation at a conference

    IEEE Design & Test (Journal)

    Said Hamdioui (Editor)

    1 Jan 201831 Dec 2018

    Activity: Publication peer-review and editorial workEditorial activity

    IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)

    Said Hamdioui (Editor)

    1 Jan 201831 Dec 2018

    Activity: Publication peer-review and editorial workEditorial activity

    Journal of Electronic Testing: theory and applications (Journal)

    Said Hamdioui (Editor)

    1 Jan 201831 Dec 2018

    Activity: Publication peer-review and editorial workEditorial activity

    IEEE Design & Test (Journal)

    Said Hamdioui (Editor)

    1 Jan 201731 Dec 2017

    Activity: Publication peer-review and editorial workEditorial activity

    Journal of Electronic Testing: theory and applications (Journal)

    Said Hamdioui (Editor)

    1 Jan 201731 Dec 2017

    Activity: Publication peer-review and editorial workEditorial activity