DfT schemes for resistive open defects in RRAMs

NZB Haron, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

34 Citations (Scopus)
Original languageEnglish
Title of host publicationDesign, automation & test in Europe conference & exhibition
Editors s.n.
Place of Publications.l.
Publishers.n.
Pages1-6
Number of pages6
Publication statusPublished - 2012
EventDATE 2012 - s.l.
Duration: 12 Mar 201216 Mar 2012

Publication series

Name
Publishers.n.

Conference

ConferenceDATE 2012
Period12/03/1216/03/12

Cite this