Effects of bit line coupling on the faulty behavior of DRAMs

Z Al-Ars, S Hamdioui, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

11 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings 22nd IEEE VLSI test symposium
Place of PublicationLos Alamitos
PublisherIEEE
Pages1-6
Number of pages6
Publication statusPublished - 2004
Event22nd IEEE VLSI test symposium, Napa Valley, USA - Los Alamitos
Duration: 25 Apr 200429 Apr 2004

Publication series

Name
PublisherIEEE Computer Society

Conference

Conference22nd IEEE VLSI test symposium, Napa Valley, USA
Period25/04/0429/04/04

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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