Effects of bit line coupling on the faulty behavior of DRAMs

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

12 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings 22nd IEEE VLSI test symposium
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	1-6
Number of pages	6
Publication status	Published - 2004
Event	22nd IEEE VLSI test symposium, Napa Valley, USA - Los Alamitos Duration: 25 Apr 2004 → 29 Apr 2004

Name
Publisher	IEEE Computer Society

Conference	22nd IEEE VLSI test symposium, Napa Valley, USA
Period	25/04/04 → 29/04/04

ed. is niet bekend

Keywords

@inproceedings{e3653660982b4b65ba0bba6ca192d66f,

title = "Effects of bit line coupling on the faulty behavior of DRAMs",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "Z Al-Ars and S Hamdioui and {van de Goor}, AJ",

note = "ed. is niet bekend; 22nd IEEE VLSI test symposium, Napa Valley, USA ; Conference date: 25-04-2004 Through 29-04-2004",

year = "2004",

language = "Undefined/Unknown",

publisher = "IEEE",

pages = "1--6",

booktitle = "Proceedings 22nd IEEE VLSI test symposium",

address = "United States",

}

TY - GEN

T1 - Effects of bit line coupling on the faulty behavior of DRAMs

AU - Al-Ars, Z

AU - Hamdioui, S

AU - van de Goor, AJ

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 1

EP - 6

BT - Proceedings 22nd IEEE VLSI test symposium

PB - IEEE

CY - Los Alamitos

T2 - 22nd IEEE VLSI test symposium, Napa Valley, USA

Y2 - 25 April 2004 through 29 April 2004

ER -