Elemental analysis at the nanometer level by Auger microscopy.

MJ van Bruggen, JJP van Es, P Kruit, AD van Langeveld

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the NVvM 2001 meeting.
Pages	88-89
Number of pages	2
Publication status	Published - 2001

Jaarboek Nederlandse Vereniging voor Microscopy (NVvM), ISSN: 1389-5362.

Keywords

@inproceedings{204b5955b4474213b0c3b30c934e1d2d,

title = "Elemental analysis at the nanometer level by Auger microscopy.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van Bruggen}, MJ and {van Es}, JJP and P Kruit and {van Langeveld}, AD",

note = "Jaarboek Nederlandse Vereniging voor Microscopy (NVvM), ISSN: 1389-5362.",

year = "2001",

language = "Undefined/Unknown",

pages = "88--89",

booktitle = "Proceedings of the NVvM 2001 meeting.",

}

TY - GEN

T1 - Elemental analysis at the nanometer level by Auger microscopy.

AU - van Bruggen, MJ

AU - van Es, JJP

AU - Kruit, P

AU - van Langeveld, AD

N1 - Jaarboek Nederlandse Vereniging voor Microscopy (NVvM), ISSN: 1389-5362.

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SP - 88

EP - 89

BT - Proceedings of the NVvM 2001 meeting.

ER -