Research output per year
Research output per year
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Dive into the research topics where P. Kruit is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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A new approach for fast field calculation in electrostatic electron lens design and optimization
Hesam Mahmoudi Nezhad, N., Ghaffarian Niasar, M., Hagen, C. W. & Kruit, P., 2024, In: Scientific Reports. 14, 1, 21 p., 4859.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile41 Downloads (Pure) -
Sidewall angle tuning in focused electron beam-induced processing
Hari, S., van Dorp, W. F., Mulders, J. J. L., Trompenaars, P. H. F., Kruit, P. & Hagen, C. W., 2024, In: Beilstein Journal of Nanotechnology. 15, p. 447-456 10 p.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile28 Downloads (Pure) -
Comparison of Different Optimization Techniques in Electron Lens Design
Hesam Mahmoudi Nezhad, N., Ghaffarian Niasar, M., Hagen, C. W. & Kruit, P., 2023, 2023 9th International Conference on Optimization and Applications, ICOA 2023 - Proceedings. Hachimi, H., Abdo, A. A. & Benmamoun, Z. (eds.). IEEE, 5 p. (2023 9th International Conference on Optimization and Applications, ICOA 2023 - Proceedings).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open AccessFile22 Downloads (Pure) -
In multi electron beam systems, “Neighbours Matter”
Mohammadi-Gheidari, A., Kieft, E. R., Guo, X., Wisse, M. & Kruit, P., 2023, In: Ultramicroscopy. 249, 17 p., 113735.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile75 Downloads (Pure) -
Method for inspecting a specimen and charged particle beam device
Cook, B. J., Kruit, P., Schmidt, R. R., Naftali, R., Barday, R., Winkler, D. & Frosien, J., 2023, IPC No. H01J, Patent No. TWI790489, Priority date 21 Oct 2019Research output: Patent
Datasets
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Data underlying the publication: Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping
Garming, M. W. H. (Creator), Bolhuis, M. (Creator), Conesa Boj, S. (Creator), Hoogenboom, J. P. (Creator) & Kruit, P. (Creator), TU Delft - 4TU.ResearchData, 14 Mar 2024
DOI: 10.4121/UUID:A7AF2E9F-6769-4E6D-8422-A7D698EF1115
Dataset/Software: Dataset
Prizes
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Microscopy Today Innovation Award 2013
Kruit, P. (Recipient), 2013
Prize: Prize (including medals and awards)
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Activities
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Microelectronic Engineering (Journal)
P. Kruit (Editor)
2005 → …Activity: Publication peer-review and editorial work › Publication peer-review
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Ultramicroscopy (Journal)
P. Kruit (Editor)
2003 → …Activity: Publication peer-review and editorial work › Editorial activity
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Design of an electron projection system with slider lenses and multiple beams
P. Kruit (Speaker)
8 Jul 2002 → …Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting
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Electron-beam-induced deposition of sub-10 nanometer structures
P. Kruit (Speaker)
16 Sept 2002 → …Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting
Press/Media
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De kiem wordt twintig jaar eerder gelegd - Interview afgenomen door Chirstine Lucassen
16/01/13
1 item of Media coverage
Press/Media: Public Engagement