Enhancing thermal degradation stability of BaSi2O2N2:Eu2+ for white light-emitting diodes by ultra-thin Al2O3 layer via atomic layer deposition

Yujie Zhao, Xiao Wang, Quan an Li, Xinyu Zhang, Ye Li, Rong Jun Xie*, J. Ruud van Ommen, H. T. Hintzen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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