Fracture morphology and mechanism of IMC in Low-Ag SAC Solder/UBM (Ni(P)-Au) for WLCSP

F Sun, P Hochstenbach, WD van Driel, GQ Zhang

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In this study, the brittle fracture of intermetallic compound (IMC) between low-Ag SnAgCu (SAC) solder and under bump metallization (UBM) under high-speed pull condition is studied for wafer-level chip-scale packages (WLCSP). The fracture morphology and fracture mechanism of IMC are analyzed by SEM, EDX and deeply etching techniques. Also, the forming mechanism of IMC and the relation with joint strength are investigated. The effects of high-temperature (HTS) aging on the fracture performance of IMC are examined. Results show that compared with keeping time, storage temperature is a much more important influencing factor on the formation of IMC and soldering joints strength. Cu content in the solder is another key influencing factor as well.
Original languageUndefined/Unknown
Pages (from-to)1167-1170
Number of pages4
JournalMicroelectronics Reliability
Issue number8-9
Publication statusPublished - 2008

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