Gate oxide induced switch-on undershoot current observed in thin-film transistors

F Yan, P Migliorato, Y Hong, V Rana, R Ishihara, Y Hiroshima, D Abe, S Inoue, T Shimoda

Research output: Contribution to journalArticleScientificpeer-review

12 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Issue number25
Publication statusPublished - 2005


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