Influence of bit line coupling and twisting on the faulty behavior of DRAMs

Z Al-Ars, S Hamdioui, AJ van de Goor, S Al-Harbi

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)2989-2996
Number of pages8
JournalIEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems
Volume25
Issue number12
Publication statusPublished - 2006

Keywords

  • academic journal papers
  • CWTS JFIS < 0.75

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