Label Correlation in Deep Learning-Based Side-Channel Analysis

Lichao Wu*, Léo Weissbart, Marina Krcek, Huimin Li, Guilherme Perin, Lejla Batina, Stjepan Picek

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
44 Downloads (Pure)

Abstract

The efficiency of the profiling side-channel analysis can be significantly improved with machine learning techniques. Although powerful, a fundamental machine learning limitation of being data-hungry received little attention in the side-channel community. In practice, the maximum number of leakage traces that evaluators/attackers can obtain is constrained by the scheme requirements or the limited accessibility of the target. Even worse, various countermeasures in modern devices increase the conditions on the profiling size to break the target. This work demonstrates a practical approach to dealing with the lack of profiling traces. Instead of learning from a one-hot encoded label, transferring the labels to their distribution can significantly speed up the convergence of guessing entropy. By studying the relationship between all possible key candidates, we propose a new metric, denoted Label Correlation (LC), to evaluate the generalization ability of the profiling model. We validate LC with two common use cases: early stopping and network architecture search, and the results indicate its superior performance.
Original languageEnglish
Pages (from-to)3849-3861
Number of pages13
JournalIEEE Transactions on Information Forensics and Security
Volume18
DOIs
Publication statusPublished - 2023

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • Side-channel analysis
  • profiling analysis
  • deep learning
  • label distribution
  • profiling model fitting

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