Measuring the in crease in effective emittance after a grid lens.

SR van Kranen, D Moonen, P Kruit

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	173-179
Number of pages	7
Journal	Microelectronic Engineering
Volume	57-58
Publication status	Published - 2001

Keywords

@article{e1bb4798ca804abb93bc81da8409c4be,

title = "Measuring the in crease in effective emittance after a grid lens.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van Kranen}, SR and D Moonen and P Kruit",

year = "2001",

language = "Undefined/Unknown",

volume = "57-58",

pages = "173--179",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier",

}