Parameter extraction for electro-thermal modeling of bipolar transistors

F Tamigi; S Mijalkovic; LK Nanver; N Nenadovic; H Schellevis; V d'Alessandro; N Rinaldi; JN Burghartz

Parameter extraction for electro-thermal modeling of bipolar transistors

F Tamigi, S Mijalkovic, LK Nanver, N Nenadovic, H Schellevis, V d'Alessandro, N Rinaldi, JN Burghartz

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	112-116
Number of pages	5
ISBN (Print)	90-73461-33-2
Publication status	Published - 2002
Event	SAFE, Veldhoven, NL - Utrecht Duration: 27 Nov 2002 → 28 Nov 2002

Publication series

Name
Publisher	STW Technology Foundation

Conference

Conference	SAFE, Veldhoven, NL
Period	27/11/02 → 28/11/02

Bibliographical note

CD-ROM

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{358b9c818b91453e894ac81b9a599278,

title = "Parameter extraction for electro-thermal modeling of bipolar transistors",

keywords = "Conf.proc. > 3 pag",

author = "F Tamigi and S Mijalkovic and LK Nanver and N Nenadovic and H Schellevis and V d'Alessandro and N Rinaldi and JN Burghartz",

note = "CD-ROM; SAFE, Veldhoven, NL ; Conference date: 27-11-2002 Through 28-11-2002",

year = "2002",

language = "Undefined/Unknown",

isbn = "90-73461-33-2",

publisher = "STW Technology Foundation",

pages = "112--116",

booktitle = "SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop",

}

Parameter extraction for electro-thermal modeling of bipolar transistors. / Tamigi, F; Mijalkovic, S; Nanver, LK et al.
SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop. Utrecht: STW Technology Foundation, 2002. p. 112-116.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Parameter extraction for electro-thermal modeling of bipolar transistors

AU - Tamigi, F

AU - Mijalkovic, S

AU - Nanver, LK

AU - Nenadovic, N

AU - Schellevis, H

AU - d'Alessandro, V

AU - Rinaldi, N

AU - Burghartz, JN

N1 - CD-ROM

PY - 2002

Y1 - 2002

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 90-73461-33-2

SP - 112

EP - 116

BT - SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop

PB - STW Technology Foundation

CY - Utrecht

T2 - SAFE, Veldhoven, NL

Y2 - 27 November 2002 through 28 November 2002

ER -