Retrofit of an Emispec data acquisition system for Auger spectroscopy and coincidence measurements in a TEM.

JJP van Es, J Nonhebel, P Kruit

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Jaarboek Nederlandse Vereniging voor Microscopie
Pages	148-149
Number of pages	2
Publication status	Published - 2000

ISSN: 1389-5362

Keywords

@inproceedings{a941c146b3264a64a341780e6615ffeb,

title = "Retrofit of an Emispec data acquisition system for Auger spectroscopy and coincidence measurements in a TEM.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van Es}, JJP and J Nonhebel and P Kruit",

note = "ISSN: 1389-5362",

year = "2000",

language = "Undefined/Unknown",

pages = "148--149",

booktitle = "Jaarboek Nederlandse Vereniging voor Microscopie",

}