Retrofit of an Emispec data acquisition system for Auger spectroscopy and coincidence measurements in a TEM.

JJP van Es, J Nonhebel, P Kruit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationJaarboek Nederlandse Vereniging voor Microscopie
    Pages148-149
    Number of pages2
    Publication statusPublished - 2000

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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