Special Session: AutoSoC: A Suite of Open-Source Automotive SoC Benchmarks

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer

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Abstract

The current demands for autonomous driving generated momentum for an increase in research in the different technologies required for these applications. Nonetheless, the limited access to representative designs and industrial methodologies poses a challenge to the research community. Considering this scenario, there is a high demand for an open-source solution that could support development of research targeting automotive applications. This paper presents the current status of AutoSoC, an automotive SoC benchmark suite that includes hardware and software elements and is entirely open-source. The objective is to provide researchers with an industrial-grade automotive SoC that includes all essential components, is fully customizable, and enables analysis of functional safety solutions and automotive SoC configurations. This paper describes the available configurations of the benchmark including an initial assessment for ASIL B to D configurations.
Original languageEnglish
Title of host publication2020 IEEE 38th VLSI Test Symposium (VTS)
Subtitle of host publicationProceedings
PublisherIEEE
Pages1-9
Number of pages9
ISBN (Electronic)978-1-7281-5359-9
ISBN (Print)978-1-7281-5360-5
DOIs
Publication statusPublished - 2020
Event2020 IEEE 38th VLSI Test Symposium (VTS) - San Diego, United States
Duration: 5 Apr 20208 Jun 2020
Conference number: 38th

Conference

Conference2020 IEEE 38th VLSI Test Symposium (VTS)
CountryUnited States
CitySan Diego
Period5/04/208/06/20

Keywords

  • Automotive benchmark
  • SoC
  • open-source
  • Functional Safety
  • ISO 26262

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    Augusto da Silva, F., Bagbaba, A. C., Ruospo, A., Mariani, R., Kanawati, G., Reorda, M. S., Jenihhin, M., Hamdioui, S., & Sauer, C. (2020). Special Session: AutoSoC: A Suite of Open-Source Automotive SoC Benchmarks. In 2020 IEEE 38th VLSI Test Symposium (VTS): Proceedings (pp. 1-9). IEEE. https://doi.org/10.1109/VTS48691.2020.9107599