SPICE modeling of single-grain Si TFTs using TFTs BSIMSOI

A Baiano, R Ishihara, N Saputra, JR Long, N Karaki, S Inoue, JW Metselaar, CIM Beenakker

Research output: Contribution to journal › Conference article › Scientific › peer-review

Keywords

@article{7bc570c4e00b4926ba5f253a94619a1c,

title = "SPICE modeling of single-grain Si TFTs using TFTs BSIMSOI",

keywords = "academic journal papers, Conf.proc. > 3 pag",

author = "A Baiano and R Ishihara and N Saputra and JR Long and N Karaki and S Inoue and JW Metselaar and CIM Beenakker",

year = "2007",

doi = "doi:10.1149/1.2767304",

language = "Undefined/Unknown",

volume = "8",

pages = "171--176",

journal = "ECS Transactions",

issn = "1938-5862",

publisher = "Electrochemical Society, Inc.",

number = "1",

}

TY - JOUR

T1 - SPICE modeling of single-grain Si TFTs using TFTs BSIMSOI

AU - Baiano, A

AU - Ishihara, R

AU - Saputra, N

AU - Long, JR

AU - Karaki, N

AU - Inoue, S

AU - Metselaar, JW

AU - Beenakker, CIM

PY - 2007

Y1 - 2007

KW - academic journal papers

KW - Conf.proc. > 3 pag

U2 - doi:10.1149/1.2767304

DO - doi:10.1149/1.2767304

M3 - Conference article

SN - 1938-5862

VL - 8

SP - 171

EP - 176

JO - ECS Transactions

JF - ECS Transactions

IS - 1

ER -