Temperature dependence of the work function of the Zr/O/W(100) Schottky electron source in typical operating conditions and its effect on beam brightness

MS Bronsgeest; P Kruit

Temperature dependence of the work function of the Zr/O/W(100) Schottky electron source in typical operating conditions and its effect on beam brightness

MS Bronsgeest, P Kruit

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	887-891
Number of pages	5
Journal	Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures
Volume	24(2)
Issue number	2
Publication status	Published - 2006

Keywords

academic journal papers
CWTS 0.75 <= JFIS < 2.00

Cite this

@article{94b894e29b7d455c8ab11ac047b79c31,

title = "Temperature dependence of the work function of the Zr/O/W(100) Schottky electron source in typical operating conditions and its effect on beam brightness",

keywords = "academic journal papers, CWTS 0.75 <= JFIS < 2.00",

author = "MS Bronsgeest and P Kruit",

year = "2006",

language = "Undefined/Unknown",

volume = "24(2)",

pages = "887--891",

journal = "Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures",

issn = "1071-1023",

publisher = "AVS Science and Technology Society",

number = "2",

}

Temperature dependence of the work function of the Zr/O/W(100) Schottky electron source in typical operating conditions and its effect on beam brightness. / Bronsgeest, MS; Kruit, P.
In: Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures, Vol. 24(2), No. 2, 2006, p. 887-891.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Temperature dependence of the work function of the Zr/O/W(100) Schottky electron source in typical operating conditions and its effect on beam brightness

AU - Bronsgeest, MS

AU - Kruit, P

PY - 2006

Y1 - 2006

KW - academic journal papers

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 1071-1023

VL - 24(2)

SP - 887

EP - 891

JO - Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures

IS - 2

ER -