@inproceedings{d6b4ef5079ac417baae5944d2c7ffd0a,
title = "Thermomechanical analysis and reliability performance of a semiconductor package using a single gauge leadframe design",
author = "{van Driel}, WD and JT Dellosa and WV Cacanindin",
note = "harvest; IMPACT 2015, Taipei, Taiwan ; Conference date: 21-10-2015 Through 23-10-2015",
year = "2015",
doi = "10.1109/IMPACT.2015.7365171",
language = "English",
isbn = "978-1-4673-8356-1",
publisher = "IEEE Society",
pages = "75--78",
editor = "CT Liu and WC Lo",
booktitle = "Proceedings of the 10th International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT",
}