Abstract
This paper discusses a method for data analysis of early failures that are typically due to defects from production and/or installation. The approach is based on Weighted Linear Regression and aims at estimating the next failure moment and the failure probability in an interval. As an additional goal, methods are intended to be suitable for light computing devices.
Original language | English |
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Title of host publication | IEEE PES Innovative Smart Grid Technologies Asia (IEEE PES ISGT‐Asia 2021) |
Place of Publication | Brisbane |
Number of pages | 5 |
ISBN (Electronic) | 978-1-6654-3339-6 |
DOIs | |
Publication status | Published - 2021 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.