Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier

IO Agbo, M Taouil, S Hamdioui, S Cosemans, P Weckx, P Raghavan, F Catthoor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015
EditorsV Casola
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-6
Number of pages6
ISBN (Print)978-1-4799-1999-4
DOIs
Publication statusPublished - 2015
EventDTIS 2015: 10th International Conference on Design and Technology of Integrated Systems in Nanoscale Era - Naples
Duration: 20 Apr 201524 Apr 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceDTIS 2015
CityNaples
Period20/04/1524/04/15

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