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Electron-beam patterned calibration structures for structured illumination microscopy
Sangeetha Hari, Johan A. Slotman, Yoram Vos, Christian Floris, Wiggert A. van Cappellen, C. W. Hagen, Sjoerd Stallinga, Adriaan B. Houtsmuller, Jacob P. Hoogenboom*
*Corresponding author for this work
Research output: Contribution to journal › Article › Scientific › peer-review
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