J.P. Hoogenboom

Dr.ir.

Applied Sciences, ImPhys/Microscopy Instrumentation & Techniques

Research activity per year

If you made any changes in Pure these will be visible here soon.

Fingerprint

Dive into the research topics where J.P. Hoogenboom is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

12 Similar Profiles

Network

Recent external collaboration on country level. Dive into details by clicking on the dots or

31 Article
5 Patent
1 Chapter
1 Entry for encyclopedia/dictionary
More
- 1 Review article

Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy
Lane, R., Vos, Y., Wolters, A. H. G., Kessel, L. V., Chen, S. E., Liv, N., Klumperman, J., Giepmans, B. N. G. & Hoogenboom, J. P., Jan 2021, In: Journal of Structural Biology: X. 5, 100046.
Research output: Contribution to journal › Article › Scientific › peer-review

Open Access
File
7 Downloads (Pure)
Beam displacement and blur caused by fast electron beam deflection
Zhang, L., Garming, M. W. H., Hoogenboom, J. P. & Kruit, P., 2020, In: Ultramicroscopy. 211, 7 p., 112925.
Research output: Contribution to journal › Article › Scientific › peer-review

Open Access
File
22 Downloads (Pure)
Integrated optical and charged particle inspection apparatus
Hoogenboom, J. P., 2020, IPC No. H01J, Priority date 18 Mar 2019, Priority No. WO 2020190136 A1
Research output: Patent
Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping
Garming, M. W. H., Bolhuis, M., Conesa-Boj, S., Kruit, P. & Hoogenboom, J. P., 2020, In: The Journal of Physical Chemistry Letters. 11, 20, p. 8880-8886 7 p.
Research output: Contribution to journal › Article › Scientific › peer-review

Open Access
File
10 Downloads (Pure)
Retarding Field Integrated Fluorescence and Electron Microscope
Vos, Y., Lane, R. I., Peddie, C. J., Wolters, A. H. G. & Hoogenboom, J. P., 2020, In: Microscopy and Microanalysis. 12 p.
Research output: Contribution to journal › Article › Scientific › peer-review

Open Access
File
1 Citation (Scopus)

2 Downloads (Pure)

Subnanometer-accuracy optical distance ruler based on fluorescence quenching by transparent conductors
Moerland, R. J. (Creator) & Hoogenboom, J. P. (Creator), TU Delft - 4TU.ResearchData, 2016
DOI: 10.4121/UUID:FB121478-2C50-4A1E-AAD4-AD46B87045E4
Dataset
Complex refractive index of ITO (Indium Tin Oxide) - ITO cover slides from Optics Balzers
Moerland, R. J. (Creator) & Hoogenboom, J. P. (Creator), TU Delft - 4TU.ResearchData, 2016
DOI: 10.4121/UUID:59FEBF27-A532-4AC9-8EC0-29D4195B2C8C
Dataset

Microscopy Today Innovation Award 2013
Hoogenboom, J.P. (Recipient), 2013
Prize: Prize (including medals and awards)