Method and Apparatus for Determining Structure Parameters of Microstructures

Omar El Gawhary (Inventor), Stefan Petra (Inventor)

Research output: Patent

Original languageEnglish
Patent numberTW 1464366
IPCG03F; G01B
Priority date21/03/11
Publication statusPublished - 2014

Bibliographical note

Patent: OCT-13-090
Applicant: ASML Netherlands B.V.

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