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Multi electron beam inspection apparatus
Pieter Kruit
(Inventor)
Research output
:
Patent
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(1)
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2019
2019
2019
1
Patent
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Patent
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2019
Multi electron beam inspection apparatus
Kruit, P.
,
2019
, IPC No. H01J, Patent No. CNZL201580057918.2, Priority date
4 Sept 2014
Research output
:
Patent