Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy

Ryan Lane^*, Yoram Vos, Anouk H.G. Wolters, Luc van Kessel, S. Elisa Chen, Nalan Liv, Judith Klumperman, Ben N.G. Giepmans, Jacob P. Hoogenboom

^*Corresponding author for this work

ImPhys/Microscopy Instrumentation & Techniques

Research output: Contribution to journal › Article › Scientific › peer-review

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Lane-optimization-2020
Lane, R. (Creator), Vos, Y. (Creator), Wolters, A. H. G. (Creator), van Kessel, L. C. P. M. (Creator), Chen, S. E. (Creator), Liv, N. (Creator), Klumperman, J. (Creator), Giepmans, B. N. G. (Creator) & Hoogenboom, J. P. (Creator), TU Delft - 4TU.ResearchData, 7 Sept 2020
DOI: 10.4121/12907205
Dataset/Software: Dataset