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Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM
Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
Research output: Contribution to journal › Article › Scientific › peer-review
8
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(Scopus)