Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

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Engineering & Materials Science