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S. Hamdioui

Prof.dr.

 https://orcid.org/0000-0002-8961-0387
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  • Conference contribution

    Variability and reliability analyses in SRAM decoder

    Seyab, MSK. & Hamdioui, S., 2013, 4th Workshop on design for reliability. s.n. (ed.). s.l.: s.n., p. 1-8 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Why is CMOS scaling coming to an END?

    Haron, NZB. & Hamdioui, S., 2008, 2008 Third international design and test workshop. Abid, M., Loulou, M., Salem, A., Zorian, Y. & Ivanov, A. (eds.). Piscataway: IEEE Society, p. 98-103 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    170 Citations (Scopus)

  • Would Magnonic Circuits Outperform CMOS Counterparts?

    Mahmoud, A., Cucu-Laurenciu, N., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2022, GLSVLSI 2022 - Proceedings of the Great Lakes Symposium on VLSI 2022. Association for Computing Machinery (ACM), p. 309-313 5 p. (Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    2 Citations (Scopus)
    19 Downloads (Pure)

  • Yield Estimation of a Memristive Sensor Array

    Gupta, V., Khandelwal, S., Panunzi, G., Martinelli, E., Hamdioui, S., Jabir, A. & Ottavi, M., 2020, 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS): Proceedings. IEEE, p. 1-2 2 p. 9159727

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Yield improvement and test cost optimization for 3D stacked ICs

    Hamdioui, S. & Taouil, M., 2011, 20th IEEE Asian Test Symposium 2011. Chatterjee, A., Patra, A., Kundu, S. & Ravi, S. (eds.). Piscataway, NJ, USA: IEEE Society, p. 480-485 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access