Hierarchical Memory Diagnosis

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

High-quality memory diagnosis methodologies are critical enablers for scaled memory devices as they reduce time to market and provide valuable information regarding test escapes and customer returns. This paper presents an efficient Hierarchical Memory Diagnosis (HMD) approach that accurately diagnoses faults in the entire memory. Faults are diagnosed hierarchically; first, their location, then their nature (i.e., static or dynamic), and finally, their functional fault model. The HMD approach leads to a more accurate diagnostic, enabling the precise identification of yield loss causes.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE European Test Symposium, ETS 2022
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages2
ISBN (Electronic)9781665467063
DOIs
Publication statusPublished - 2022
Event27th IEEE European Test Symposium, ETS 2022 - Barcelona, Spain
Duration: 23 May 202227 May 2022

Publication series

NameProceedings of the European Test Workshop
Volume2022-May
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference27th IEEE European Test Symposium, ETS 2022
Country/TerritorySpain
CityBarcelona
Period23/05/2227/05/22

Keywords

  • Algorithm
  • Diagnosis
  • Fault
  • Memory
  • Test

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