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J.M. Kuiper
Dr.ir.
Aerospace Engineering
,
Space Systems Engineering
https://orcid.org/0000-0002-9240-9932
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Research output
(38)
Activities
(1)
Similar Profiles
(6)
Supervised Work
(1)
Research output
17
Conference contribution
10
Article
4
Patent
2
Abstract
5
More
2
Review article
1
Chapter
1
Paper
1
Dissertation (TU Delft)
Research output per year
Research output per year
4 results
Publication Year, Title
(descending)
Publication Year, Title
(ascending)
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Patent
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2010
Inspection apparatus for lithography
Kuiper, JM.
,
2010
, IPC No. aangevraagd door ASML NL, Veldhoven (NL), Patent No. US 2010/0302521 A1, Priority date
2 Dec 2010
Research output
:
Patent
Inspection method and apparatus, and lithographic apparatus
Kuiper, JM.
,
2010
, Patent No. WO 2010/020506 A1, Priority date
25 Feb 2010
Research output
:
Patent
Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus
Kok, HV.
,
Kivits, K.
,
van de Laak, R.
,
Kuiper, JM.
,
van der Zouw, G.
&
Tolsma, HPT.
,
2010
, IPC No. aangevraagd door ASML NL, Veldhoven (NL), Patent No. US7,773,235 B2, Priority date
10 Aug 2010
Research output
:
Patent
Passive reticle tool, a lithographic apparatus and a method of patterning a device in a lithography tool
van de Kerkhof, MA.
,
de Boeij, WP.
,
van Greevenbroek, HRM.
,
Klaassen, MFH.
,
Kok, HV.
,
Wehrens, MGD.
,
Uitterdijk, T.
,
Rooijakkers, WJM.
,
Kuiper, JM.
,
van Dooren, L.
,
Sonneveld, J.
&
Giling, EJM.
,
2010
, IPC No. aangevraagd door ASML NL, Veldhoven (NL), Patent No. US 2010/0182582 A1, Priority date
22 Jul 2010
Research output
:
Patent