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Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes
Shayesteh Masoumian, Roel Maes, Rui Wang, Karthik Keni Yerriswamy, Geert-Jan Schrijen , Said Hamdioui, Mottaqiallah Taouil
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review