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M. Taouil, MSc

 https://orcid.org/0000-0002-9911-4846
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  • BTI analysis of SRAM write driver

    Agbo, IO., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2015, Proceedings of the 10th International Design and Test Symposium, IDT 2015. Kurdahi, F., Mir, S. & Yu, MO. (eds.). Piscataway: IEEE Society, p. 100-105 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    6 Citations (Scopus)

  • Boolean Logic Gate Exploration for Memristor Crossbar

    Xie, L., Du Nguyen, H. A., Taouil, M., Hamdioui, S. & Bertels, K., 2016, Proceedings - 11th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2016. Danvers, MA: IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    13 Citations (Scopus)

  • Balanced Dual-Mask Protection Scheme for GIFT Cipher Against Power Attacks

    Aljuffri, A. A. M., Reinbrecht, C., Hamdioui, S., Taouil, M. & Sepulveda, J., 2022, 2022 IEEE 40th VLSI Test Symposium (VTS). 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    34 Downloads (Pure)

  • A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    File
    5 Citations (Scopus)
    104 Downloads (Pure)

  • A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks

    Aljuffri, A., Saxena, M., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2023, Proceedings of the 2023 26th Euromicro Conference on Digital System Design (DSD). Niar, S., Ouarnoughi, H. & Skavhaug, A. (eds.). Piscataway: IEEE, p. 87-94 8 p. (Proceedings - 2023 26th Euromicro Conference on Digital System Design, DSD 2023).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Applications of Computation-In-Memory Architectures based on Memristive Devices

    Hamdioui, S., Du Nguyen, H. A., Taouil, M., Sebastian, A., Le Gallo, M., Pande, S., Schaafsma, S., Catthoor, F., Das, S., G. Redondo, F., Karunaratne, G., Rahimi, A. & Benini, L., 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019: Proceedings. IEEE, p. 486-491 6 p. 8715020

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    File
    33 Citations (Scopus)
    1001 Downloads (Pure)

  • A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

    Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    File
    5 Citations (Scopus)
    41 Downloads (Pure)

  • A Computation-In-Memory Accelerator Based on Resistive Devices

    Du Nguyen, H. A., Yu, J., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, Proceedings of the International Symposium on Memory Systems. New York: Association for Computing Machinery (ACM), p. 19-32 14 p. (ICPS: ACM International Conference Proceeding Series).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)
    2 Downloads (Pure)

  • 3D-COSTAR: a cost model for 3D stacked ICs

    Taouil, M., Hamdioui, S., Marinissen, EJ. & Bhawmik, S., 2012, Proceedings Third IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits. Zorian, Y., Marijnissen, E. & Hamdioui, S. (eds.). Los Alamitos, CA, USA: IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review