Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs

S. Yuan, Z. Zhang, M. Fieback, H. Xun, E. J. Marinissen, G. S. Kar, S. Rao, S. Couet, M. Taouil, S. Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)


The development of Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) mass production requires high-quality test solutions. Accurate and appropriate fault modeling is crucial for the realization of such solutions. This paper targets fault modeling and test generation for all interconnect and contact defects in STT-MRAMs and shows that using the defect injection and circuit simulation for fault modeling without incorporating the impact of magnetic coupling will result in an incomplete set of fault models; hence, not obtaining accurate fault models. Magnetic coupling introduced by the stray field is an inherent property of STT-MRAMs and may foster the occurrence of additional memory faults. Not considering the magnetic coupling clearly will give rise to test escapes. The paper introduces a compact model for STT-MRAM that incorporates the intra- and inter-cell stray field, uses this model to derive the full set of fault models for interconnect and contact defects, and finally proposes an efficient test solution.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE International Test Conference, ITC 2023
Number of pages10
ISBN (Electronic)9798350343250
Publication statusPublished - 2023
Event2023 IEEE International Test Conference, ITC 2023 - Anaheim, United States
Duration: 7 Oct 202315 Oct 2023

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


Conference2023 IEEE International Test Conference, ITC 2023
Country/TerritoryUnited States

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.


  • fault modeling
  • magnetic coupling
  • stray field
  • test development


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