Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs

S. Yuan, Z. Zhang, M. Fieback, H. Xun, E. J. Marinissen, G. S. Kar, S. Rao, S. Couet, M. Taouil, S. Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

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