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S. Hamdioui

Prof.dr.

 https://orcid.org/0000-0002-8961-0387

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  • Conference contribution

    Non-algorithmic stress optimization using simulation for DRAMs

    Al-Ars, Z. & Hamdioui, S., 2009, 4th Intl. design and test workshop 2009. s.n. (ed.). Piscataway: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Non-Volatile Look-up Table Based FPGA Implementations

    Xie, L., Du Nguyen, H. A., Taouil, M., Hamdioui, S., Bertels, K. & Alfailakawi, M., 2016, Proceedings : 11th IEEE International Design & Test Symposium. Tourki, R. (ed.). Piscataway, NJ, USA: IEEE, 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    13 Citations (Scopus)

  • On BTI Aging Rejuvenation in Memory Address Decoders

    Cem Gursoy, C., Kraak, D., Ahmed, F., Taouil, M., Jenihhin, M. & Hamdioui, S., 2022, Proceedings of the 2022 IEEE 23rd Latin American Test Symposium (LATS). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    15 Downloads (Pure)

  • On Correcting Cluster Errors in Nanoelectronic Memories

    Haron, NZB. & Hamdioui, S., 2011, Proceedings of 3rd Workshop on Design for Reliability (DFR'11). Orailoglu, A., Michael, MK., Sazeides, Y. & Theocharides, T. (eds.). Crete, Greece: HiPEAC, p. 63-68 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • On Defect Oriented Testing for Hybrid CMOS/memristor Memory

    Haron, NZB. & Hamdioui, S., 2011, 20th IEEE Asian Test Symposium 2011. Chatterjee, A., Patra, A., Kundu, S. & Ravi, S. (eds.). Piscataway, NJ, USA: IEEE Society, p. 353-358 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    66 Citations (Scopus)

  • Online Fault Detection and Diagnosis in RRAM

    Fieback, M., Bradarić, F., Taouil, M. & Hamdioui, S., 2023, Proceedings of the 2023 IEEE European Test Symposium (ETS). IEEE, 6 p. (Proceedings of the European Test Workshop; vol. 2023-May).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    27 Downloads (Pure)

  • On maximizing the compound yield for 3D wafer-to-wafer stacked ICs

    Taouil, M., Hamdioui, S., Verbree, J. & Marinissen, E., 2010, Intl. TEST conference 2010. s.n. (ed.). Piscataway: IEEE Society, p. 1-10 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    31 Citations (Scopus)

  • On Modeling and Optimizing Cost in 3D Stacked-ICs

    Taouil, M., Hamdioui, S. & Marinissen, E., 2011, 6th IEEE International Design and Test Workshop during ICECS 2011. Sawan, M. & Harmanani, H. (eds.). Piscataway, NJ, USA: IEEE Society, p. 24-29 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    4 Citations (Scopus)

  • On Optimizing Test Cost for Wafer-to-Wafer 3D Stacked ICs

    Taouil, M. & Hamdioui, S., 2012, 7th International conference on design & technology of integrated systems in nanoscale era. s.n. (ed.). s.l.: s.n., p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • On resistive open defect detection in DRAMs: The charge accumulation effect

    Sfikas, Y., Tsiatouhas, YE., Taouil, M. & Hamdioui, S., 2015, Proceedings - 20th IEEE European Test Symposium. Miclea, L. & Prinetto, P. (eds.). Piscataway, NJ, USA: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access

  • On the Analysis of Real-time Operating System Reliability in Embedded Systems

    Mamone, D., Bosio, A., Savino, A., Hamdioui, S. & Rebaudengo, M., 2020, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings. Dilillo, L., Psarakis, M. & Siddiqua, T. (eds.). IEEE, p. 1-6 6 p. 9250861. (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    256 Downloads (Pure)

  • On the Reliability of RRAM-Based Neural Networks

    Aziza, H., Zambelli, C., Hamdioui, S., Diware, S., Bishnoi, R. & Gebregiorgis, A., 2023, Proceedings of the 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC). IEEE, 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • On the Robustness of Memristor Based Logic Gates

    Xie, L., Du Nguyen, H. A., Yu, J., Taouil, M. & Hamdioui, S., 2017, 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Dietrich, M. & Novak, O. (eds.). Piscataway: IEEE, p. 158-163 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Optimizing Memory BIST Address Generator Implementations

    van de Goor, AJ., Kukner, H. & Hamdioui, S., 2011, Proceedings 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era. Bernard, S. & Efstathiou, C. (eds.). Piscataway, NJ, USA: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    10 Citations (Scopus)

  • Optimizing test length for soft faults in DRAM devices

    Al-Ars, Z., Hamdioui, S. & Gaydadjiev, GN., 2007, 25th IEEE VLSI Test Symposium. s.n. (ed.). Piscataway: IEEE Society, p. 59-66 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    6 Citations (Scopus)

  • Parallel Matrix Multiplication on Memristor-Based Computation-in-Memory Architecture

    Haron, A., Yu, J., Nane, R., Taouil, M., Hamdioui, S. & Bertels, K., 2016, 2016 International Conference on High Performance Computing & Simulation (HPCS): 14th Annual Meeting. Piscataway: IEEE, p. 759-766 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    20 Citations (Scopus)
    400 Downloads (Pure)

  • Perspectives on Emerging Computation-in-Memory Paradigms

    Rai, S., Liu, M., Gebregiorgis, A., Bhattacharjee, D., Chakrabarty, K., Hamdioui, S., Chattopadhyay, A., Trommer, J. & Kumar, A., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 1925-1934 10 p. 9473976

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • PetaOps/W edge-AI μ Processors: Myth or reality?

    Gomony, M. D., de Putter, F., Gebregiorgis, A., Paulin, G., Mei, L., Jain, V., Hamdioui, S., Bishnoi, R., Sanchez, V. & More Authors, 2023, Proceedings of the 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    30 Downloads (Pure)

  • Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    15 Citations (Scopus)

  • Port interference faults in two-port memories

    Hamdioui, S. & van de Goor Ph D, AJ., 1999, Proceedings. S.l.: IEEE Society, p. 1001-1010 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    10 Citations (Scopus)

  • Power Side Channel Attacks: Where Are We Standing?

    Taouil, M., Aljuffri, A. A. M. & Hamdioui, S., 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    10 Citations (Scopus)

  • PPM recuction on embedded memories in system on chip

    Hamdioui, S., Al-Ars, Z., Jimenez, J. & Calero, J., 2007, 12th IEEE European Test Symposium. Lisa O'Conner (ed.). Piscataway: IEEE Society, p. 85-90 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Protecting IoT Devices through a Hardware-driven Memory Verification

    Köylü, T. Ç., Okkerman, H., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2021, 2021 24th Euromicro Conference on Digital System Design (DSD): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 115-122 8 p. 9556394

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    103 Downloads (Pure)

  • PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory

    Fieback, M., Münch, C., Gebregiorgis, A., Cardoso Medeiros, G., Taouil, M., Hamdioui, S. & Tahoori, M., 2022, Proceedings of the 2022 IEEE European Test Symposium (ETS). Danvers: IEEE, p. 1-6 6 p. 9810436

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    89 Downloads (Pure)

  • Quality versus cost analysis for 3D Stacked ICs

    Taouil, M., Hamdioui, S. & Marinissen, EJ., 2014, Proceedings - 32nd IEEE VLSI Test Symposium. Thibeault, C. (ed.). Los Alamitos, CA, USA: IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    6 Citations (Scopus)

  • Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability

    Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2016, Proceedings - IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2016). Taskin, B. & Ghosal, P. (eds.). Los Alamitos, CA: IEEE, p. 725-730 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    18 Citations (Scopus)

  • Read-disturb Detection Methodology for RRAM-based Computation-in-Memory Architecture

    Yaldagard, M. A., Diware, S., Joshi, R. V., Hamdioui, S. & Bishnoi, R., 2023, 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS). 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    13 Downloads (Pure)

  • Read Path Degradation Analysis in SRAM

    Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2016, Proceedings - 21st IEEE European Test Symposium, ETS 2016. Danvers, MA: IEEE, p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    9 Citations (Scopus)

  • Realistic fault models and test procedure for multi-port SRAMs

    Hamdioui, S., van de Goor, AJ., Eastwick, D. & Rodgers, M., 2001, Proceedings. Los Alamitos: IEEE, p. 65-72 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Rebooting Computing: The Challenges for Test and Reliability

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., di Natale, G., Anghel, L., Nagarajan, S., Fieback, M. C. R. & Hamdioui, S., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    8 Citations (Scopus)

  • Recent Trends and Perspectives on Defect-Oriented Testing

    Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielenk, G., Guerriero, A. M., Hamdioui, S. & More Authors, 2022, Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. Savino, A., Rech, P., Di Carlo, S. & Gizopoulos, D. (eds.). Institute of Electrical and Electronics Engineers (IEEE), 10 p. (Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    31 Downloads (Pure)

  • Referencing-in-Array Scheme for RRAM-based CIM Architecture

    Singh, A., Bishnoi, R., Joshi, R. V. & Hamdioui, S., 2022, Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. Bolchini, C., Verbauwhede, I. & Vatajelu, I. (eds.). IEEE, p. 1413-1418 6 p. 9774571

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    22 Downloads (Pure)

  • Region disjoint paths in a class of optimal line graph networks

    Joshi, PD., Sen, A., Hamdioui, S. & Bertels, K., 2014, Proceedings - 17th IEEE International Conference on Computational Science and Engineering (CSE 2014). El Baz, D., Liu, X., Hsu, CH., Kang, K. & Chen, W. (eds.). Los Alamitos, CA, USA: IEEE, p. 1256-1260 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    2 Citations (Scopus)

  • Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes

    Masoumian, S., Selimis, G., Wang, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, p. 1189-1192 4 p. 9774735

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    2 Citations (Scopus)
    42 Downloads (Pure)

  • Reliability challenges of real-time systems in forthcoming technology nodes

    Hamdioui, S., Gizopoulos, D., Guido, G. & Nicolaidis, M., 2013, Design, automation & test in Europe conference & exhibition. s.n. (ed.). Piscataway: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    79 Citations (Scopus)

  • Residue-based code for reliable hybrid memories

    Haron, NZB. & Hamdioui, S., 2009, 2009 IEEE/ACM international symposium on nanoscale architectures. s.n. (ed.). Piscataway: IEEE Society, p. 27-32 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron

    Caetano Garaffa, L., Aljuffri, A., Reinbrecht, C., Hamdioui, S., Taouil, M. & Sepulveda, J., 2021, 2021 24th Euromicro Conference on Digital System Design (DSD): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 514-518 5 p. 9556441

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    196 Downloads (Pure)

  • ReverseAge: an Online NBTI Combating Technique Using Time Borrowing

    Seyab, MSK. & Hamdioui, S., 2011, 6th IEEE International Design and Test Workshop (IDT 2011). Sawan, M. & Harmanani, H. (eds.). Piscataway, NJ, USA: IEEE Society, p. 36-41 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • RNN-based Detection of Fault Attacks on RSA

    Köylü, T. C., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, p. 1-5 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    147 Downloads (Pure)

  • RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs)

    Gebregiorgis, A., Zografou, A. & Hamdioui, S., 2022, Proceedings of the 2022 IEEE European Test Symposium (ETS). Danvers: IEEE, p. 1-2 2 p. 9810414

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    16 Downloads (Pure)

  • RRAM Variability and its Mitigation Schemes

    Pouyan, P., Amat, E., Hamdioui, S. & Rubio, A., 2016, 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2016. Piscataway, NJ: IEEE, p. 141-146 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    17 Citations (Scopus)
    137 Downloads (Pure)

  • Scan more with memory scan test

    Hamdioui, S. & Al-Ars, Z., 2009, 4th IEEE international conference on design & technology of integrated systems in nanoscale era. s.n. (ed.). Piscataway: IEEE Society, p. 204-209 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing

    Xie, L., Du Nguyen, H. A., Yu, J., Kaichouhi, A., Taouil, M., AlFailakawi, M. & Hamdioui, S., 2017, 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI). Hübner, M., Reis, R., Stan, M. & Voros, N. (eds.). Piscataway: IEEE, p. 176-181 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    90 Citations (Scopus)

  • Security methods in fault tolerant modified line graph based networks

    Joshi, PD. & Hamdioui, S., 2014, Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Ottavi, M. & Hamdioui, S. (eds.). Piscataway, NJ, USA: IEEE Society, p. 57-62 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access

  • Shortest path reduction in a class of uniform fault tolerant networks

    Joshi, PD. & Hamdioui, S., 2014, Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Ottavi, M. & Hamdioui, S. (eds.). Piscataway, NJ, USA: IEEE Society, p. 234-239 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access

  • SieveMem: A Computation-in-Memory Architecture for Fast and Accurate Pre-Alignment

    Shahroodi, T., Miao, M., Zahedi, M., Wong, S. & Hamdioui, S., 2023, Proceedings of the 2023 IEEE 34th International Conference on Application-specific Systems, Architectures and Processors (ASAP). IEEE, p. 156-164 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    4 Downloads (Pure)

  • Skeleton-based design and simulation flow for Computation-in-Memory architectures

    Yu, J., Nane, R., Haron, A., Hamdioui, S., Corporaal, H. & Bertels, K., 2016, 2016 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH). Zhao, W. & Moritz, C. A. (eds.). New York: Association for Computing Machinery (ACM), p. 165-170 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    10 Citations (Scopus)
    60 Downloads (Pure)

  • Smart Redundancy Schemes for ANNs against Fault Attacks

    Köylü, T. Ç., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 IEEE European Test Symposium (ETS). Danvers: IEEE, p. 1-2 2 p. 9810380

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    45 Downloads (Pure)

  • S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX

    Aljuffri, A., Venkatachalam, P., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, Embedded Computer Systems: Architectures, Modeling, and Simulation - 20th International Conference, SAMOS 2020, Proceedings. Orailoglu, A., Jung, M. & Reichenbach, M. (eds.). Springer, p. 295-307 13 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 12471 LNCS).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    File
    4 Citations (Scopus)
    108 Downloads (Pure)