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S. Hamdioui

Prof.dr.

 https://orcid.org/0000-0002-8961-0387

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  • Conference contribution

    Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability

    Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2016, Proceedings - IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2016). Taskin, B. & Ghosal, P. (eds.). Los Alamitos, CA: IEEE, p. 725-730 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    18 Citations (Scopus)

  • Read-disturb Detection Methodology for RRAM-based Computation-in-Memory Architecture

    Yaldagard, M. A., Diware, S., Joshi, R. V., Hamdioui, S. & Bishnoi, R., 2023, 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS). 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    14 Downloads (Pure)

  • Read Path Degradation Analysis in SRAM

    Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2016, Proceedings - 21st IEEE European Test Symposium, ETS 2016. Danvers, MA: IEEE, p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    9 Citations (Scopus)

  • Realistic fault models and test procedure for multi-port SRAMs

    Hamdioui, S., van de Goor, AJ., Eastwick, D. & Rodgers, M., 2001, Proceedings. Los Alamitos: IEEE, p. 65-72 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Rebooting Computing: The Challenges for Test and Reliability

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., di Natale, G., Anghel, L., Nagarajan, S., Fieback, M. C. R. & Hamdioui, S., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    8 Citations (Scopus)

  • Recent Trends and Perspectives on Defect-Oriented Testing

    Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielenk, G., Guerriero, A. M., Hamdioui, S. & More Authors, 2022, Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. Savino, A., Rech, P., Di Carlo, S. & Gizopoulos, D. (eds.). Institute of Electrical and Electronics Engineers (IEEE), 10 p. (Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    31 Downloads (Pure)

  • Referencing-in-Array Scheme for RRAM-based CIM Architecture

    Singh, A., Bishnoi, R., Joshi, R. V. & Hamdioui, S., 2022, Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. Bolchini, C., Verbauwhede, I. & Vatajelu, I. (eds.). IEEE, p. 1413-1418 6 p. 9774571

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    23 Downloads (Pure)

  • Region disjoint paths in a class of optimal line graph networks

    Joshi, PD., Sen, A., Hamdioui, S. & Bertels, K., 2014, Proceedings - 17th IEEE International Conference on Computational Science and Engineering (CSE 2014). El Baz, D., Liu, X., Hsu, CH., Kang, K. & Chen, W. (eds.). Los Alamitos, CA, USA: IEEE, p. 1256-1260 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    2 Citations (Scopus)

  • Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes

    Masoumian, S., Selimis, G., Wang, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, p. 1189-1192 4 p. 9774735

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    2 Citations (Scopus)
    49 Downloads (Pure)

  • Reliability challenges of real-time systems in forthcoming technology nodes

    Hamdioui, S., Gizopoulos, D., Guido, G. & Nicolaidis, M., 2013, Design, automation & test in Europe conference & exhibition. s.n. (ed.). Piscataway: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    79 Citations (Scopus)

  • Residue-based code for reliable hybrid memories

    Haron, NZB. & Hamdioui, S., 2009, 2009 IEEE/ACM international symposium on nanoscale architectures. s.n. (ed.). Piscataway: IEEE Society, p. 27-32 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron

    Caetano Garaffa, L., Aljuffri, A., Reinbrecht, C., Hamdioui, S., Taouil, M. & Sepulveda, J., 2021, 2021 24th Euromicro Conference on Digital System Design (DSD): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 514-518 5 p. 9556441

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    201 Downloads (Pure)

  • ReverseAge: an Online NBTI Combating Technique Using Time Borrowing

    Seyab, MSK. & Hamdioui, S., 2011, 6th IEEE International Design and Test Workshop (IDT 2011). Sawan, M. & Harmanani, H. (eds.). Piscataway, NJ, USA: IEEE Society, p. 36-41 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • RNN-based Detection of Fault Attacks on RSA

    Köylü, T. C., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, p. 1-5 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    151 Downloads (Pure)

  • RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs)

    Gebregiorgis, A., Zografou, A. & Hamdioui, S., 2022, Proceedings of the 2022 IEEE European Test Symposium (ETS). Danvers: IEEE, p. 1-2 2 p. 9810414

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    18 Downloads (Pure)

  • RRAM Variability and its Mitigation Schemes

    Pouyan, P., Amat, E., Hamdioui, S. & Rubio, A., 2016, 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2016. Piscataway, NJ: IEEE, p. 141-146 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    17 Citations (Scopus)
    139 Downloads (Pure)

  • Scan more with memory scan test

    Hamdioui, S. & Al-Ars, Z., 2009, 4th IEEE international conference on design & technology of integrated systems in nanoscale era. s.n. (ed.). Piscataway: IEEE Society, p. 204-209 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing

    Xie, L., Du Nguyen, H. A., Yu, J., Kaichouhi, A., Taouil, M., AlFailakawi, M. & Hamdioui, S., 2017, 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI). Hübner, M., Reis, R., Stan, M. & Voros, N. (eds.). Piscataway: IEEE, p. 176-181 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    90 Citations (Scopus)

  • Security methods in fault tolerant modified line graph based networks

    Joshi, PD. & Hamdioui, S., 2014, Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Ottavi, M. & Hamdioui, S. (eds.). Piscataway, NJ, USA: IEEE Society, p. 57-62 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access

  • Shortest path reduction in a class of uniform fault tolerant networks

    Joshi, PD. & Hamdioui, S., 2014, Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Ottavi, M. & Hamdioui, S. (eds.). Piscataway, NJ, USA: IEEE Society, p. 234-239 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access

  • SieveMem: A Computation-in-Memory Architecture for Fast and Accurate Pre-Alignment

    Shahroodi, T., Miao, M., Zahedi, M., Wong, S. & Hamdioui, S., 2023, Proceedings of the 2023 IEEE 34th International Conference on Application-specific Systems, Architectures and Processors (ASAP). IEEE, p. 156-164 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    4 Downloads (Pure)

  • Skeleton-based design and simulation flow for Computation-in-Memory architectures

    Yu, J., Nane, R., Haron, A., Hamdioui, S., Corporaal, H. & Bertels, K., 2016, 2016 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH). Zhao, W. & Moritz, C. A. (eds.). New York: Association for Computing Machinery (ACM), p. 165-170 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    10 Citations (Scopus)
    62 Downloads (Pure)

  • Smart Redundancy Schemes for ANNs against Fault Attacks

    Köylü, T. Ç., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 IEEE European Test Symposium (ETS). Danvers: IEEE, p. 1-2 2 p. 9810380

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    46 Downloads (Pure)

  • S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX

    Aljuffri, A., Venkatachalam, P., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, Embedded Computer Systems: Architectures, Modeling, and Simulation - 20th International Conference, SAMOS 2020, Proceedings. Orailoglu, A., Jung, M. & Reichenbach, M. (eds.). Springer, p. 295-307 13 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 12471 LNCS).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    4 Citations (Scopus)
    108 Downloads (Pure)

  • Space of DRAM fault models and corresponding testing

    Al-Ars, Z., Hamdioui, S. & van de Goor, AJ., 2006, Design Automation & Test in Europe DATE 06. s.n. (ed.). Piscataway: IEEE Society, p. 1252-1257 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • SparseMEM: Energy-efficient Design for In-memory Sparse-based Graph Processing

    Zahedi, M., Custers, G., Shahroodi, T., Gaydadjiev, G., Wong, S. & Hamdioui, S., 2023, Proceedings of the 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    22 Downloads (Pure)

  • Special Session: STT-MRAMs: Technology, Design and Test

    Gebregiorgis, A., Wu, L., Münch, C., Rao, S., Tahoori, M. B. & Hamdioui, S., 2022, Proceedings - of the 2022 IEEE 40th VLSI Test Symposium, VTS 2022. IEEE, 10 p. 9794278

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    98 Downloads (Pure)

  • Special Session: AutoSoC: A Suite of Open-Source Automotive SoC Benchmarks

    Augusto da Silva, F., Bagbaba, A. C., Ruospo, A., Mariani, R., Kanawati, G., Reorda, M. S., Jenihhin, M., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE 38th VLSI Test Symposium (VTS): Proceedings. IEEE, p. 1-9 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    434 Downloads (Pure)

  • Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

    Bishnoi, R., Wu, L., Fieback, M., Munch, C., Nair, S. M., Tahoori, M., Wang, Y., Li, H. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE, Vol. 2020-April. 9107595. (Proceedings of the IEEE VLSI Test Symposium; vol. 2020-April).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    9 Citations (Scopus)

  • Spin Wave Based 4-2 Compressor

    Mahmoud, A., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2021, 2021 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Proceedings. Piscataway: IEEE, p. 1-4 4 p. 9665499. (2021 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Proceedings).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    2 Citations (Scopus)
    28 Downloads (Pure)

  • Spin wave based full adder

    Mahmoud, A., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2021, 2021 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, 5 p. 9401524. (2021 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    6 Citations (Scopus)
    62 Downloads (Pure)

  • Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost

    Taouil, M. & Hamdioui, S., 2011, IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems. Kraemer, R., Steininger, A., Pawlak, A. & et al. (eds.). Piscataway, NJ, USA: IEEE Society, p. 335-340 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    6 Citations (Scopus)

  • Standards-based tools and services for building lifelong learning pathways

    Sgouropoulou, C., Voyiatzis, I., Koutoumanos, A., Hamdioui, S., Pouyan, P., Comte, M., Prinetto, P., Airò Farulla, G., Ellervee, P., Delgado Kloos, C. & Crespo Garcia, R., 2017, 2017 IEEE Global Engineering Education Conference (EDUCON). Piscataway, NJ: IEEE, p. 1619-1621 3 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Structured Test Development Approach for Computation-in-Memory Architectures

    Fieback, M., Taouil, M. & Hamdioui, S., 2022, Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia). Ceballos, C. (ed.). Piscataway: IEEE, p. 61-66 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    13 Downloads (Pure)

  • SW-based transparent in-field memory testing

    Bernardi, P., Ciganda, L., Reorda, MS. & Hamdioui, S., 2015, Proceedings - 16th IEEE Latin-American Test Symposium. Champac, V. & Zorian, Y. (eds.). Piscataway, NJ, USA: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
    6 Citations (Scopus)

  • Synthesizing HDL to Memristor Technology: A Generic Framework

    Du Nguyen, H. A., Xie, L., Taouil, M., Hamdioui, S. & Bertels, K., 2016, 2016 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH). Zhao, W. & Moritz, C. A. (eds.). New York: Association for Computing Machinery (ACM), p. 43-48 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    11 Citations (Scopus)

  • System Design for Computation-in-Memory: From Primitive to Complex Functions

    Zahedi, M., Shahroodi, T., Custers, G., Singh, A., Wong, S. & Hamdioui, S., 2022, Proceedings of the 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    6 Citations (Scopus)
    39 Downloads (Pure)

  • Temperature dependence of NBTI induced delay

    Seyab, MSK. & Hamdioui, S., 2010, 16th IEEE intl. on-line testing symposium. s.n. (ed.). Piscataway: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    23 Citations (Scopus)

  • Temperature impact on NBTI modeling in the framework of technology scaling

    Seyab, MSK. & Hamdioui, S., 2010, 5th Intl. conf, HIPEAC 2010. Patt, Y., Foglia, P., Duesterwald, E., Faraboschi, P. & Martorell, X. (eds.). Heidelberg: Springer, p. 1-10 10 p. (Lecture Notes in Computer Science; vol. 5952).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Test and Reliability of Emerging Non-Volatile Memories

    Hamdioui, S., Pouyan, P., Li, H., Wang, Y., Raychowdhur, A. & Yoon, I., 2017, 2017 IEEE 26th Asian Test Symposium (ATS). O’Conner, L. (ed.). Piscataway, NJ : IEEE, p. 170-178 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Test cost analysis for 3D die-to-wafer stacking

    Taouil, M., Hamdioui, S., Beenakker, CIM. & Marinissen, E., 2010, Proc. of the 19th Asian test symposium. s.n. (ed.). Piscataway: IEEE Society, p. 435-441 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    52 Citations (Scopus)

  • Testing Computation-in-Memory Architectures Based on Emerging Memories

    Hamdioui, S., Fieback, M., Nagarajan, S. & Taouil, M., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p. 9000117

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    13 Citations (Scopus)
    187 Downloads (Pure)

  • Testing for Parasitic Memory Effect in SRAMs

    Irobi, IS., Al-Ars, Z., Hamdioui, S. & Thibeault, C., 2011, 20th IEEE Asian Test Symposium 2011. Chatterjee, A., Patra, A., Kundu, S. & Ravi, S. (eds.). Piscataway, NJ, USA: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access

  • Testing PUF-based secure key storage circuits

    Cortez, AMMO., Roelofs, G., Hamdioui, S. & di Natale, G., 2014, Proceedings of the 2014 International Conference on Design, Automation & Test in Europe. Fettweis, G. & Nebel, W. (eds.). Leuven, Belgium: EDAA, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access

  • Testing Resistive Memories: Where Are We and What Is Missing?

    Fieback, M., Taouil, M. & Hamdioui, S., 2018, International Test Conference 2018 - Proceedings. Piscataway, NJ: IEEE, p. 1-9 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    19 Citations (Scopus)

  • Testing Scouting Logic-Based Computation-in-Memory Architectures

    Fieback, M., Nagarajan, S., Bishnoi, R., Tahoori, M., Taouil, M. & Hamdioui, S., 2020, Proceedings - 2020 IEEE European Test Symposium, ETS 2020: Proceedings. IEEE, p. 1-6 6 p. 9131604. (Proceedings of the European Test Workshop; vol. 2020-May).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    12 Citations (Scopus)

  • Testing static and dynamic faults in random access memories

    Hamdioui, S., Al-Ars, Z. & van de Goor, AJ., 2002, 20th VLSI Test symposium; Proceedings. Piscataway, NJ, USA: IEEE Society, p. 395-401 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    107 Citations (Scopus)

  • Tests for address decoder delay faults in RAMs due to inter-gate opens

    van de Goor, AJ., Hamdioui, S. & Al-Ars, Z., 2004, Proceedings of the 9th IEEE European Test Symposium. Los Alamitos: IEEE, p. 146-153 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    3 Citations (Scopus)

  • The effectiveness of Scan test and its new variants

    van de Goor, AJ., Hamdioui, S. & Al-Ars, Z., 2004, Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004. Titsworth, FM. (ed.). Piscataway: IEEE, p. 26-31 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)